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Double-ended Pogo Pin Test Probe SCPC026 for Integrated Circuit Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPC026 we will introduce is 0.26 mm in barrel diameter and 5.3 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This probe pin could withstand the current up to 2 amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 0.8 mm. But it is better to be pressed at a distance of 0.5 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.5 mm, the loaded force is about 21 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Barrel: Ph/SP, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SUS304, Au on Ni Plated
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.7 GHz at -1dB
Inductive Reactance: 1MHZ at -0.07638 uH
Capacitive Reactance: 1MHZ at 0.332478 uF
Full Stroke: 0.8 mm
Rated Stroke: 0.5 mm
Spring Force: 21±6 gf at load 0.5 mm
Mechanical Life: about 100000 cycles
Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world.
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
|Payment Terms :||T/T in advance|
|Packaging Info :||plastic bottle, plastic bag, carton box|
|Delivery Info :||DHL, FedEx, UPS, etc.|
|Model Number :||SCPC026-XY-53-0.7HG(BB)|
|Barrel :||Phosphor Bronze or Gold Clad Phosphor Bronze, Au on Ni Plated|
|Bottom Plunger :||Beryllium Copper, Au on Ni Plated|
|Top Plunger :||Beryllium Copper, Au on Ni Plated|
|Spring :||SUS304, Au on Ni Plated|
|Current Rating :||2 Amps|
|Contact Resistance :||100 Milliohms Max|
|Bandwidth :||7.7 GHz at -1dB|
|Inductive Reactance :||1MHz at -0.07638 uH|
|Capacitive Reactance :||1 MHz at 0.332478 UF|
|Full Stroke :||0.8 mm|
|Rated Stroke :||0.5 mm|
|Spring Force :||21 gf at Load 0.5 mm|
|Mechanical Life :||about 100000 Cycles|
|Total Length :||5.3 mm|
|Barrel Diameter :||0.26 mm|
Semiconductor test probes are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
Product Keywords: pogo pin, test probe, test pin, double-ended pogo pin, integrated circuit test probe, integrated circuit test pin, integrated circuit test pogo pin, IC test probe, IC test pin, IC test pogo pin
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